Instrumentation

JEM 2100 - a 200kV TEM from JEOL

This high resolution EM is configured with a high tilt polepiece and specimen holder for tomography and has other analytical capabilities:

• EDAX Genesis 4000 Energy Dispersive X-Ray system for elemental analysis
• STEM attachment with bright field, dark field and
  backscattered electron detectors
• Gatan Orius (11 megapixels) in-line digital camera
• Gatan single tilt and double tilt Be holders

Zeiss Supra 55V

Analytical FEGSEM with Variable Pressure mode, enabling imaging of
vacuum-sensitive and / or non-conductive samples without the need to apply conductive coatings.

Fully motorised 5-axis stage, and a range of detectors:-

• Everhart-Thornley Secondary Electron detector
• Zeiss Gemini In-Lens Secondary Electron detector
• Backscattered Electron Detector (Centaurus)
• VPSE Variable Pressure Secondary Electron Detector
• EDAX Genesis 4000 Energy Dispersive X-Ray system for elemental analysis
• HKL Electron Backscattered Diffraction system (EBSD)

JEM 1400 - a 120kV TEM from JEOL

A high contrast TEM with Windows interface

• AMT XR60 mid-mount digital camera of 11 megapixels
  
• Gatan rotate/tilt holder + multiple specimen holder
  

JEM 1010 - a 100kV TEM from JEOL

A high contrast TEM equipped with a Deben Sprite specimen relocation system

• Gatan BioScan CCDTV with Digital Micrograph image acquisition
• Single tilt grid holder
• Tilt/rotation interchangeable with 2000fx

Specimen preparation facilities

• Quorum sputter coater
• Edwards carbon evaporator
• Gatan Precision Ion Polishing System (PIPS)

• Struers Tenupol for electro-polishing
• Dimpler (Gatan)
• Disc cutter (Gatan)
• Disc grinder (Gatan)
• South Bay Tech tripod polisher
• Ultrasonic drill (Gatan)
  

• Polaron critical point drying apparatus
• Leica AFS and AFS2 freeze-substitution apparatus
• Leica MM80 impact freezer
• Ultramicrotomes: Two Leica UCT and one Leica OMUE
• VT1000 vibrating microtome from Leica